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Profiling THz Beams With Off-Label Use of Infrared Microbolometric Cameras

arXiv:2602.19635v2 Announce Type: replace Abstract: Visualizing the spatial profile of light beams is essential for evaluating irradiance, characterizing beam quality, and achieving precise alignment. In the optical spectral range, this is readily performed using silicon-based...

🔗 Read more: https://arxiv.org/abs/2602.19635

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